The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
May. 08, 2001
Timothy M Dubois, Moss Beach, CA (US);
Jacques Senchet, San Francisco, CA (US);
Craig Martell, Lilburn, GA (US);
Guna (Ned) Nedumaran, Cary, NC (US);
Timothy M Dubois, Moss Beach, CA (US);
Jacques Senchet, San Francisco, CA (US);
Craig Martell, Lilburn, GA (US);
Guna (Ned) Nedumaran, Cary, NC (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A method of presenting an analysis of enterprise wide business data. In response to a user request to a web site operable to access enterprise wide business data and to provide statistical analysis, a six sigma enabled BIS transfers an electronic document to the user. The electronic document allows the user to select dimensions to specify which data to analyze for a given performance measure. Then, in response to a request from the user for a statistical analysis, the six sigma enabled BIS performs a statistical analysis of the performance measure and transfers an electronic copy of the statistical analysis to the user. In one embodiment the document comprises a histogram. The histogram has an overlay indicator of the statistical mean, as well as a target limit. In this fashion, the user may view the variance in the data, and see how much data are outside the target range.