The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Nov. 25, 2008
Applicant:

Peter Chow, Hayes Middlesex, GB;

Inventor:

Peter Chow, Hayes Middlesex, GB;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for assessing wave propagation in a physical system by numerical simulation; a computational domain comprises first grid cells with a first-grid time step, refined second grid cells with a second-grid time step, and intermediate grid cells of first-grid cell size and second-grid time step, with solution points located on the cells; obtaining values of a physical quantity after a first-grid time step at a solution point of one first-grid cell; using values from the first grid to obtain values at a perimeter of the intermediate grid; obtaining values of the physical quantity after the second-grid time step; using values from the intermediate grid to obtain the values at the perimeter of the second grid; using the values at the perimeter of the second grid, to obtain values of the physical quantity after a second-grind time step for solution points of the second-grind cell.


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