The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Jul. 25, 2006
Applicants:

John P. Miller, Eden Prairie, MN (US);

Ravi Kant, Savage, MN (US);

Inventors:

John P. Miller, Eden Prairie, MN (US);

Ravi Kant, Savage, MN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

In methods and systems that may facilitate detecting abnormal operation in a process plant, values of a process variable are analyzed to determine whether they significantly deviate from expected values. If there is a significant deviation, an indicator may be generated. Analyzing the process variable may include, for example, determining whether a number of values of the process variable are increasingly deviating from expected values, or determining whether the process variable is cycling. Analyzing the process variable may also include, for example, processing and analyzing the process variable to determine whether the process is in a normal state, one or more abnormal states, or an indeterminate state.


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