The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Nov. 19, 2007
Applicant:

Dominic Beier, Guetersloh, DE;

Inventor:

Dominic Beier, Guetersloh, DE;

Assignee:

Miele & Cie. KG, Guetersloh, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting an error in a measurement cycle. The method includes wirelessly transmitting a sequence of electrical signals sweeping through a predetermined frequency band from a transmitter to the receiver of an electric evaluation circuit of household appliance controller. The levels of the signals are measured, and a parameter is calculated from the signal levels in the evaluation circuit. The parameter is compared to an upper and lower limit, and the quality of the measurement cycle is determined as a function of the comparison.


Find Patent Forward Citations

Beier, Dominic. (2010). Method for detecting an error in a measurement cycle (U.S. Patent No. 7657398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7657398

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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