The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Jul. 14, 2006
Applicants:

David Alumbaugh, Berkeley, CA (US);

Jiuping Chen, Albany, CA (US);

Frank Morrison, Berkeley, CA (US);

Inventors:

David Alumbaugh, Berkeley, CA (US);

Jiuping Chen, Albany, CA (US);

Frank Morrison, Berkeley, CA (US);

Assignee:

WesternGeco L.L.C., Houston, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique includes performing first electromagnetic field measurements to obtain a first set of data and performing second electromagnetic field measurements to obtain a second set of data. The first set of data is relatively sensitive to an effect caused by an air layer boundary and is relatively insensitive to the presence of a resistive body. The second set of data is relatively insensitive to the effect and is relatively sensitive to the presence of the resistive body. The technique includes combining the first and second sets of data to generate a third set of data, which is relatively insensitive to the effect and is relatively sensitive to the presence of the resistive body.


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