The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Sep. 27, 2007
Jonathan D. Bradford, Harpersfield, OH (US);
Timothy Siorek, Newbury, OH (US);
Martin George Gach, Mentor on the Lake, OH (US);
Mark Joseph Balewski, Independence, OH (US);
Robert J. Kretschmann, Bay Village, OH (US);
Kendal R. Harris, Mentor, OH (US);
Kenwood H. Hall, Hudson, OH (US);
Charles Martin Rischar, Chardon, OH (US);
Jonathan D. Bradford, Harpersfield, OH (US);
Timothy Siorek, Newbury, OH (US);
Martin George Gach, Mentor on the Lake, OH (US);
Mark Joseph Balewski, Independence, OH (US);
Robert J. Kretschmann, Bay Village, OH (US);
Kendal R. Harris, Mentor, OH (US);
Kenwood H. Hall, Hudson, OH (US);
Charles Martin Rischar, Chardon, OH (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
Systems and methods that vary multiple data sampling rates, to collect sets of data with different levels of granularity for an industrial system. The data for such industrial system includes sets of data from the 'internal' data stream(s) (e.g., history data collected from an industrial unit) and sets of data from an 'external' (e.g., traffic data on network services) data stream(s), based in part on the criticality/importance criteria assigned to each collection stage. Each set of data can be assigned its own unique data collection rate. For example, a higher sample rate can be employed when collecting data from the network during an operation stage that is deemed more critical (e.g., dynamic attribution of predetermined importance factors) than the rest of the operation.