The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Aug. 05, 2005
Izumi Yokota, Kawasaki, JP;
Katsuji Yamaguchi, Kawasaki, JP;
Izumi Yokota, Kawasaki, JP;
Katsuji Yamaguchi, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A method, apparatus, and system for evaluation of a faulty point in a multi-stage optical amplifying and repeating transmission line which provides a totally new technique for searching for faults neither of the typical 'command response type' or the 'DCR method'. When a fault occurs in an optical submarine cable, the profile exhibited by the optical spectral characteristics of the optical noise signal (ASE) successively amplified through the chain of optical amplifying repeaters at the downstream side of the faulty point changes in accordance with the number of the repeaters. The technique finds the number of the repeaters until the faulty point based on the change in the profile so as to evaluate the location of the faulty point and has a step (S) of monitoring the optical spectrum at the light receiving end and a step (S) of determining the location of the faulty point from the monitored optical spectrum.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile