The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Dec. 20, 2004
Applicants:

Eric Saund, San Carlos, CA (US);

Bryan Pendleton, Menlo Park, CA (US);

Kimon Roufas, Cambridge, MA (US);

Hadar Shemtov, Palo Alto, CA (US);

Inventors:

Eric Saund, San Carlos, CA (US);

Bryan Pendleton, Menlo Park, CA (US);

Kimon Roufas, Cambridge, MA (US);

Hadar Shemtov, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with one aspect of the present exemplary embodiments, a calibration arrangement is configured to assist in calibration of a surface scanning system where the calibration arrangement includes a preconfigured physical object which may embody dimensional information wherein the dimensional information is used to calibrate a surface of the scanning system. In an alternative embodiment, the preconfigured physical object is configured to obtain data for use in calibration of the surface of a pan/tilt surface scanning system.


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