The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Nov. 24, 2008
Jeffrey Wayne Eberhard, Albany, NY (US);
Bernard Erich Hermann Claus, Niskayuna, NY (US);
Cynthia Elizabeth Landberg, Clifton Park, NY (US);
Serge Louis Wilfrid Muller, Guyancourt, FR;
Yann Delmas, Coubevoie, FR;
Reinhold Franz Wirth, Ballston Spa, NY (US);
James George Morrow, Wauwatosa, WI (US);
Jeffrey Wayne Eberhard, Albany, NY (US);
Bernard Erich Hermann Claus, Niskayuna, NY (US);
Cynthia Elizabeth Landberg, Clifton Park, NY (US);
Serge Louis Wilfrid Muller, Guyancourt, FR;
Yann Delmas, Coubevoie, FR;
Reinhold Franz Wirth, Ballston Spa, NY (US);
James George Morrow, Wauwatosa, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A tomosynthesis system for forming a three dimensional image of an object is provided. The system includes an X-ray source adapted to irradiate the object with a beam of X-rays from a plurality of positions in a sector, an X-ray detector positioned relative to the X-ray source to detect X-rays transmitted through the object and a processor which is adapted to generate a three dimensional image of the object based on X-rays detected by the detector. The detector is adapted to move relative to the object and/or the X-ray source is adapted to irradiate the object with the beam of X-rays such that the beam of X-rays follows in a non arc shaped path and/or a center of the beam of X-rays impinges substantially on the same location on the detector from different X-ray source positions in the sector.