The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Jan. 28, 2006
Adolf Friedrich Fercher, Vienna, AT;
Adolf Friedrich Fercher, Vienna, AT;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
The invention is directed to a device for determining the thickness, distance and/or profile of areas of a transparent and/or diffuse object that are spaced apart, in particular for measuring distances in the eye. In the device for determining position using an interferometer arrangement based on the Michelson principle, a scanning unit is arranged for the change in path length in the reference beam or measurement beam path. The scanning unit comprises a scan table which is movable translationally in corresponding guides, the movement direction enclosing an angle α to the reference beam. At least two reference mirrors having a distance d in direction of the reference beam and slightly overlapping laterally are arranged on the scan table so that during the oscillating movement of the scan table carried out by a motor the reference beam is reflected in itself first by the first reference mirror and then by the second reference mirror.