The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Dec. 14, 2007
Applicants:
Hong Tan, San Jose, CA (US);
Yushan Tan, Shanghai, CN;
Krista Leah Witte, Hayward, CA (US);
Greg L. Carricato, San Jose, CA (US);
Scott Lockard, Los Gatos, CA (US);
Inventors:
Hong Tan, San Jose, CA (US);
Yushan Tan, Shanghai, CN;
Krista Leah Witte, Hayward, CA (US);
Greg L. Carricato, San Jose, CA (US);
Scott Lockard, Los Gatos, CA (US);
Assignee:
Fortebio, Inc., Menlo Park, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus and method for detecting an analyte in a sample based on optical interference. The apparatus includes a light source, detector unit and one or more disposable detector tips. The apparatus also includes an optical coupling assembly that couples light from the source to the detector tips, and from the detector tips to the detector unit.