The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Jul. 21, 2006
Applicants:

Scott Spuler, Westminster, CO (US);

Shane Mayor, Boulder, CO (US);

Inventors:

Scott Spuler, Westminster, CO (US);

Shane Mayor, Boulder, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A lidar system capable of remotely identifying calibrated absolute aerosol backscatter coefficients of atmospheric aerosol particles by transmitting a beam of light and spectrally separating the intensity of Rayleigh and Mie backscattering is disclosed. The transmitter features high pulse energy to generate sufficient Rayleigh backscattering, enabling atmospheric scanning in a timely manner. The transmitter employs a seeded Nd:YAG laser and a seeded stimulated Raman scattering wavelength shifter to achieve narrow bandwidth, eye-safe laser pulses. The receiver employs a telescope, collimating lens, beam splitter, molecular absorption filter, focusing lenses, and avalanche photodiodes. Mie backscattering is blocked by the molecular absorption filter to provide a Rayleigh signal, which is used with knowledge of atmospheric density to calibrate the Mie signal. The system is intended for atmospheric research and aerosol monitoring applications where calibrated Mie scattering intensity is necessary to measure the optical depths of aerosol structures such as plumes, clouds, and layers.


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