The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Sep. 25, 2007
Applicant:

Kazuhiko Kojima, Osaka, JP;

Inventor:

Kazuhiko Kojima, Osaka, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image pickup apparatus includes a finder optical system capable of guiding an observation beam to a finder window, the observation beam being a beam traveling from a photographing optical system and reflected by a main reflecting surface; and a first image pickup device configured to detect the observation beam and generate an image signal. The finder optical system has a first reflecting surface that reflects the observation beam. The first reflecting surface can change a reflection angle of the observation beam. A path of the observation beam can be switched between a first optical path and a second optical path by changing the reflection angle of the first reflecting surface. The first optical path is reflected by the first reflecting surface and directed toward the finder window, while the second optical path is reflected by the first reflecting surface and directed toward the first image pickup device.


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