The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

May. 26, 2004
Applicants:

Baskaran Vijayakumar, Mountain View, CA (US);

Konstantine I. Iourcha, San Jose, CA (US);

Inventors:

Baskaran Vijayakumar, Mountain View, CA (US);

Konstantine I. Iourcha, San Jose, CA (US);

Assignee:

Via Technologies, Inc., Hsin-Tien, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for texture filtering is provide wherein a filler select module is adapted to select a filtering mode based upon a sampling rate of polygon and texture data. The filter mode is selected by determining the filter characteristics of the selected filtering mode based upon the sampling rate and a degree of warping per texture coordinate. A texture reconstruction filter characteristic is morphed based upon the input polygon and texture data so that, after subsamples are aggregated, an effective filter characteristic matches the texture reconstruction filter characteristic of a texture reconstruction filter used for coarse sampling. Subsequently, a texel blending module computes texel blending factors based on the filtering mode determined by the filter select module.


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