The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Mar. 15, 2005
Heon Jin Choi, Seoul, KR;
Jae Chul Pyun, Seoul, KR;
Heon Jin Choi, Seoul, KR;
Jae Chul Pyun, Seoul, KR;
Korea Institute of Science and Technology, Seoul, KR;
Abstract
This invention relates to a nanowire-assisted method for mass spectrometric analysis of a specimen. More specifically, by using nanowire which can fix a specimen and perform desorption/ionization of the specimen while effectively transferring laser energy to the specimen to be irradiated, thereby enabling to perform mass spectrometric analysis without using a matrix solution. This invention, by effectively performing desorption/ionization of a specimen using the above-mentioned nanowire, enables to effectively perform qualitative-, quantitative-, and micro-analyses of specimens as well as low molecular weighted specimens. Further, this invention enables to the typical device of mass spectrometric analysis used in MALDI-T of MS. In particular, this invention can perform mass spectrometric analysis of a specimen with molecular weight of less than 1,000 Da and perform quantitative analysis by fixing a specimen with a predetermined area.