The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Jan. 29, 2009
Harald Schadwinkel, Hannover, DE;
Hubert Wahl, Stadtroda, DE;
Dieter Schau, Lehesten, DE;
Carl Zeiss Microimaging GmbH, Jena, DE;
Abstract
A scanning microscope with a light source which emits illumination light for illuminating a specimen, with at least a first detector for detecting the detection light proceeding from the specimen, and with an objective through which the specimen can be illuminated and detected, wherein the objective is arranged in an illumination beam path and in a detection beam path, and with a second detector for non-descanned detection of the detection light proceeding from the specimen, wherein a compact assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination beam path and/or detection beam path of the scanning microscope, wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.