The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Mar. 09, 2007
Applicants:

Michael Anthony Marra, Iii, Lexington, KY (US);

Randall David Mayo, Georgetown, KY (US);

John Thomas Writt, Lexington, KY (US);

Inventors:

Michael Anthony Marra, III, Lexington, KY (US);

Randall David Mayo, Georgetown, KY (US);

John Thomas Writt, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for decreasing sensitivity to errors in an imaging apparatus includes, defining an ideal pattern of dot locations as a rectilinear grid formed by an intersection of a plurality of rasters and a plurality of vertical columns; for each raster of the plurality of rasters defining a plurality of groups of dot locations; and for each raster of the plurality of rasters, vertically shifting some groups of the plurality of groups of dot locations while not vertically shifting a remainder of groups of the plurality of groups of dot locations so as to define a non-ideal vertically shifted pattern of dot locations.


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