The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Dec. 28, 2007
Qing Liu, Shenzhen, CN;
Jun-qi LI, Shenzhen, CN;
Takeo Nakagawa, Tokyo, JP;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe () comprising a tip extension (), a displacement sensor (), and a processor () connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.