The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Apr. 27, 2007
James A. Taylor, Livermore, CA (US);
Sharon A. Gavarre, Fremont, CA (US);
Faris Hindi, Mountain View, CA (US);
Tim K. Emami, San Jose, CA (US);
James A. Taylor, Livermore, CA (US);
Sharon A. Gavarre, Fremont, CA (US);
Faris Hindi, Mountain View, CA (US);
Tim K. Emami, San Jose, CA (US);
Net App, Inc., Sunnyvale, CA (US);
Abstract
A storage management module for evaluating and repairing errors during monitoring or testing of storage devices of a storage system is described herein. When a storage device exhibits errors that reaches (in number) an error threshold, the storage management module determines whether any errors are due to damaged sectors localized in a single physical area of a predetermined size (referred to as a 'patch') of a platter of the storage device using the physical addresses of the errors. Two or more errors may be grouped as a single error if they are located within a predetermined threshold distance from each other on a platter and counted as a single error against the error threshold. A patch containing two or more damaged sectors is referred to as a 'damaged' patch. In some embodiments, all sectors of a damaged patch (including undamaged sectors) are reassigned to spare sectors.