The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Jan. 27, 2006
Sung-hyu Han, Seoul, KR;
Myung-sun Kim, Uiwang-si, KR;
Young-sun Yoon, Suwon-si, KR;
Sun-nam Lee, Suwon-si, KR;
Bong-seon Kim, Seongnam-si, KR;
Jae-heung Lee, Suwon-si, KR;
Sung-hyu Han, Seoul, KR;
Myung-sun Kim, Uiwang-si, KR;
Young-sun Yoon, Suwon-si, KR;
Sun-nam Lee, Suwon-si, KR;
Bong-seon Kim, Seongnam-si, KR;
Jae-heung Lee, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of measuring round trip time (RTT) and a proximity checking method using the same. The method of measuring RTT includes: transmitting a hashed second random number and starting the RTT measurement; and receiving a hashed first random number from a device that received the hashed second random number and ending the RTT measurement, thereby greatly reducing repetitive encryption and decryption operations in the proximity check using a repetitive RTT measurement.