The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Mar. 30, 2005
Zijian Zheng, Bellevue, WA (US);
Mark B. Mydland, Bothell, WA (US);
Pyungchul Kim, Sammamish, WA (US);
Nancy E. Jacobs, Redmond, WA (US);
Zijian Zheng, Bellevue, WA (US);
Mark B. Mydland, Bothell, WA (US);
Pyungchul Kim, Sammamish, WA (US);
Nancy E. Jacobs, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
The subject invention leverages data logging of responses to diagnostic reports to provide data that can be mined for diagnostic report quality information. Instances of the subject invention provide an initial diagnostic report assessment means to facilitate review by an entity. The entity's responses to the sorted diagnostic reports are logged unobtrusively to create diagnostic report quality data. This data is then analyzed by an analysis means that can then adjust the assessment means to improve its performance. In this manner, the performance of the assessment means is increased while reducing the workload of the entity reviewing the diagnostic reports. Other instances of the subject invention facilitate to increase the performance of a diagnostic report generating means as well. Instances of the subject invention can also employ machine learning techniques to facilitate in analyzing the quality data and/or in assessing the diagnostic reports.