The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Apr. 13, 2007
Tien-li Chia, Mayfield Village, OH (US);
Irving Lefkowitz, Charlottesville, VA (US);
Coleman B. Brosilow, Rehovot, IL;
Alireza Haji-valizadeh, Twinsburg, OH (US);
Shahid Parvez, Willoughby Hills, OH (US);
John T. Nagle, Willowick, OH (US);
Tien-Li Chia, Mayfield Village, OH (US);
Irving Lefkowitz, Charlottesville, VA (US);
Coleman B. Brosilow, Rehovot, IL;
Alireza Haji-Valizadeh, Twinsburg, OH (US);
Shahid Parvez, Willoughby Hills, OH (US);
John T. Nagle, Willowick, OH (US);
ControlSoft, Inc., Highland Heights, OH (US);
Abstract
Various methods and systems for the parametric control of a process include representing the process with a process model used to generate future predictions of a process variable. In one embodiment, the process exhibits integrating behavior that is represented by a non-integrating process model. In another embodiment, an inverse of the model is filtered using a filter that includes a lead time constant that is selected to minimize a steady state error of the predicted process variable. In yet another embodiment, an array of output model values is revised or reindexed in response to a change in a time-varying parameter related to the process.