The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Jun. 26, 2008
Joachim Baumann, Munich, DE;
Christian David, Lauchringen, DE;
Martin Engelhardt, Munich, DE;
Jörg Freudenberger, Kalchreuth, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Matthias Honal, Munich, DE;
Thomas Mertelmeier, Erlangen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, Munich, DE;
Joachim Baumann, Munich, DE;
Christian David, Lauchringen, DE;
Martin Engelhardt, Munich, DE;
Jörg Freudenberger, Kalchreuth, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Matthias Honal, Munich, DE;
Thomas Mertelmeier, Erlangen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, Munich, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method and a measurement system are disclosed for the noninvasive determination of properties of an object to be examined and to the use of a contrast medium for X-ray phase-contrast measurement. in at least one embodiment of the invention, a mixture (suspension) consisting of a base liquid and a multiplicity of particles contained therein is used, the refractive index of the base liquid being different to the refractive index of the particles.