The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Sep. 28, 2007
Clarence L. Gordon, Iii, Glenville, NY (US);
Manoharan Venugopal, Bangalore, IN;
Debasish Mishra, Clifton Park, NY (US);
Raghu Chatanathodi, Calicut, IN;
Richard Henry Bossi, Renton, WA (US);
Michael Craig Hutchinson, Kent, WA (US);
Clarence L. Gordon, III, Glenville, NY (US);
Manoharan Venugopal, Bangalore, IN;
Debasish Mishra, Clifton Park, NY (US);
Raghu Chatanathodi, Calicut, IN;
Richard Henry Bossi, Renton, WA (US);
Michael Craig Hutchinson, Kent, WA (US);
General Electric Company, Niskayuna, NY (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system is provided for radiographic inspection of an object comprising multiple having different material properties. The system comprises a radiation source configured to generate radiation, a display unit for generating a graphical user interface (GUI) including multiple fields. A user enters input data via the fields in the GUI. The input data relates to one or more material properties for each of the regions. A processor is configured to compute a plurality of exposure parameters based on the input data.