The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Jul. 18, 2006
Ann L. Mccarthy, Lexington, KY (US);
Edul N. Dalal, Webster, NY (US);
Wencheng Wu, Webster, NY (US);
Dale R. Mashtare, Bloomfield, NY (US);
Raja Bala, Webster, NY (US);
Ann L. McCarthy, Lexington, KY (US);
Edul N. Dalal, Webster, NY (US);
Wencheng Wu, Webster, NY (US);
Dale R. Mashtare, Bloomfield, NY (US);
Raja Bala, Webster, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Consistency of document reprints is improved by recording characteristics of a reference printing system used to produce a reference printing of a document, determining related characteristics of a reprint printing system, retrieving the recorded characteristics and compensating for differences between the reference system and the reprint system in the reprint system prior to using the reprint system to produce reprints of the document. Analytical test prints (TPs) are produced with the respective printing systems in close temporal association to the production of the respective reference prints and reprints. TPs can be customized according to aspects of the document. TP customization allows the compensation to address aspects of the printing systems that have a bearing on perceived consistency in the reprints. TPs can be customized with regard to colors in test patches or both the colors and locations of test patches on a page. Compensation is based on measurements of the TPs.