The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Sep. 11, 2006
Alessandro Foi, Tampere, FI;
Vladimir Katkovnik, Tampere, FI;
Dmitriy Paliy, Tampere, FI;
Karen Egiazarian, Tampere, FI;
Mejdi Trimeche, Tampere, FI;
Sakari Alenius, Lempäälä, FI;
Radu Bilcu, Tampere, FI;
Markku Vehvilainen, Tampere, FI;
Alessandro Foi, Tampere, FI;
Vladimir Katkovnik, Tampere, FI;
Dmitriy Paliy, Tampere, FI;
Karen Egiazarian, Tampere, FI;
Mejdi Trimeche, Tampere, FI;
Sakari Alenius, Lempäälä, FI;
Radu Bilcu, Tampere, FI;
Markku Vehvilainen, Tampere, FI;
Nokia Corporation, Espoo, FI;
Abstract
An apparatus, method, mobile station and computer program product are provided for filtering noise from a digital signal. In particular, a signal-dependent noise model is used that provides the pointwise (or pixelwise) standard deviation of the temporal noise of raw data outputted from a digital imaging sensor as a function of the image intensity. In addition, unlike conventional noise models, the standard deviation of the noise (σ) is a parameterized function, where the parameters are key characteristics of the digital imaging sensor. These parameters may include, for example, the pedestal level (p), the quantum efficiency (q), and the analogue gain (α) associated with the digital imaging sensor.