The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
May. 11, 2007
Vadim Backman, Chicago, IL (US);
Hemant Roy, Highland Park, IL (US);
Young Kim, West Lafayette, IN (US);
Yang Liu, Somerset, NJ (US);
Vladimir Turzhitsky, Evanston, IL (US);
Jeremy Rogers, Chicago, IL (US);
Vadim Backman, Chicago, IL (US);
Hemant Roy, Highland Park, IL (US);
Young Kim, West Lafayette, IN (US);
Yang Liu, Somerset, NJ (US);
Vladimir Turzhitsky, Evanston, IL (US);
Jeremy Rogers, Chicago, IL (US);
Northwestern University, Evanston, IL (US);
NorthShore University HealthSystem, Evanston, IL (US);
Abstract
Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy are described within this application. One embodiment includes providing incident light comprising at least one spectral component having low coherence, wherein the incident light is to be illuminated on a target object in vivo. An intensity of one or more of at least one spectral component and at least one angular component of backscattering angle of backscattered light is recorded, wherein the backscattered light is to be backscattered from illumination of the incident light on the target object and wherein the backscattering angle is an angle between incident light propagation direction and backscattered light propagation direction. The intensity of the at least one spectral component and the at least one backscattering angle of backscattered light is analyzed, to obtain one or more optical markers of the backscattered light, toward evaluating said properties.