The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Dec. 06, 2006
Keiichi Edamatsu, Natori, JP;
Ryosuke Shimizu, Sendai, JP;
Nobuyuki Matsuda, Kakuda, JP;
Japan Science and Technology Agency, Saitama, JP;
Abstract
An optical nonlinear evaluation device () capable of accurately evaluating the optical nonlinearity of a Kerr medium in accordance with a phase difference caused by cross-phase modulation generated in the Kerr medium includes: a polarization Sagnac interference path () provided with a Kerr medium (); an optical pulse light source () for supplying a signal beam (Dsig); a polarization beam splitter (PBS) for splitting the signal beam (Dsig) into a signal beam (Hsig) and a signal beam (Vsig) polarized in a direction orthogonal to the signal beam (Hsig), for supplying the signal beam (Hsig) to a first side of the Kerr medium (), and for supplying the signal beam (Vsig) to a second side of the Kerr medium (); a glass plate () for entering, onto the signal beam (Hsig), a control beam (Vcont) for causing a change in phase difference between the signal beam (Hsig) and the signal beam (Vsig); separating means for separating the control beam (Vcont) from the signal beam (Hsig) having traveled through the Kerr medium (); and a detection section () provided so as to detect the phase difference between the signal beam (Hsig) and the signal beam (Vsig).
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