The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2010
Filed:
Mar. 10, 2008
Younane Abousleiman, Norman, OK (US);
John Brumley, Duncan, OK (US);
Vinh Ngyuen, Norman, OK (US);
Son K. Hoang, Norman, OK (US);
Ashraf Al-tahini, Dhahran, SA;
Younane Abousleiman, Norman, OK (US);
John Brumley, Duncan, OK (US);
Vinh Ngyuen, Norman, OK (US);
Son K. Hoang, Norman, OK (US);
Ashraf Al-Tahini, Dhahran, SA;
The Board of Regents of the University of Oklahoma, Norman, OK (US);
Abstract
A test cell and method for stress testing a test specimen including a first platen and a second platen. Each platen having a loading surface, an inclined surface, and a longitudinal axis. The inclined surface being inclined relative to the longitudinal axis at an angle and the inclined surface having a specimen recess formed therein for receiving a portion of the test specimen such that when the inclined surface of the second platen is positioned in a face-to-face relationship with the inclined surface of the first platen, a shear stress is applied to the test specimen when an axial load is applied to the first and second platens. The platens further including fluid ports to subject the test specimen to fluid flow at various pressures and fluid chemistries and ultrasonic transducers to determine acoustic, compressional, and shear wave velocities and in multiple orientations.