The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Feb. 27, 2007
Ravi Ramaswami, Austin, TX (US);
Michael D. Bienek, Austin, TX (US);
Ravi Ramaswami, Austin, TX (US);
Michael D. Bienek, Austin, TX (US);
Abstract
A device is provided for detecting temperature-induced delays in a combinational logic path. A signal at the output of the logic path is latched at a first latch using a primary clock signal. The primary clock signal is delayed by a delay element to provide a delayed clock signal. The output of the logic path is latched at a second latch using the delayed clock signal. The delay element delays the clock signal by an amount that indicates the occurrence of an over-temperature condition at the logic path. A comparator compares the data latched at the first latch to the data latched at the second latch and provides an error signal indicative of an over-temperature condition if the first and second latch contain different data values.