The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Jun. 22, 2007
Applicant:

Jeffrey J Welty, Tacoma, WA (US);

Inventor:

Jeffrey J Welty, Tacoma, WA (US);

Assignee:

Weyerhaeuser NR Company, Federal Way, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

Aspects of the present invention are directed at estimating the value of an attribute at a specified geographic location. In one embodiment, a method is provided that estimates the elevation at a principal point using LiDAR data that was collected from spatially related secondary points. More specifically, the method includes identifying secondary points where sample attribute data was obtained that are within a predetermined distance to the principal point where the attribute is being estimated. A secondary point may be selected and allocated a masking zone and a determination made regarding whether one or more distant secondary points are within the area of the masking zone. In this regard, more distant secondary points that are inside a masking zone may be assigned less relevance when estimating the value of the attribute.


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