The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Sep. 30, 2005
Applicants:

Eric G. Dorgelo, Port Moody, CA;

Kevin G. Gordon, Annacis Island Delta, CA;

Clifton H. Bromley, New Westminister, CA;

Douglas J. Reichard, Fairview, OH (US);

Marc D. Semkow, Burnaby, CA;

Shafin A. Virji, Vancouver, CA;

Inventors:

Eric G. Dorgelo, Port Moody, CA;

Kevin G. Gordon, Annacis Island Delta, CA;

Clifton H. Bromley, New Westminister, CA;

Douglas J. Reichard, Fairview, OH (US);

Marc D. Semkow, Burnaby, CA;

Shafin A. Virji, Vancouver, CA;

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Historical and real-time data access is leveraged to provide unified data access for interacting with manufacturing process entities such as, for example, process overview displays, charting systems, reporting systems, logging systems, and/or recipe systems and the like. The unified data, for example, allows for playback of historical process overviews for a user selected period of time. In one instance, a 'VCR like' user interface can be employed to allow 'rewinding' and 'replaying' of a historical process overview. This facilitates in proper monitoring and/or troubleshooting of manufacturing processes. The unified availability of past and current data also enables reporting systems to provide 'living' reports that automatically update with real-time data. This can allow for efficient comparison of current data with historical data for a given manufacturing process.


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