The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Dec. 05, 2005
Applicants:

Ying Shan, West Windsor, NJ (US);

Rakesh Kumar, West Windsor, NJ (US);

Harpreet Sawhney, West Windsor, NJ (US);

Inventors:

Ying Shan, West Windsor, NJ (US);

Rakesh Kumar, West Windsor, NJ (US);

Harpreet Sawhney, West Windsor, NJ (US);

Assignee:

Sarnoff Corporation, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for unsupervised learning of measures for matching objects between images from at least two non-overlapping cameras is disclosed The method includes collecting at least two pairs of feature maps, where the at least two pairs of feature maps are derived from features of objects captured in the images. The method further includes computing, as a function of at least two pairs of feature maps, at least one first and second match measures, wherein the first match measure is of a same class and the second match measure is of a different class.


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