The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7650014 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 19, 2010

Filed:

Jan. 12, 2006
Applicants:

Hitoshi Ikeda, Kanagawa, JP;

Motofumi Fukui, Kanagawa, JP;

Takahiko Kuwabara, Kanagawa, JP;

Inventors:

Hitoshi Ikeda, Kanagawa, JP;

Motofumi Fukui, Kanagawa, JP;

Takahiko Kuwabara, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image analysis apparatus includes a unit that accepts plural dynamic image data obtained by imaging a subject to be recognized from positions different from each other, a unit that detects a part to be detected of the subject to be recognized from series of frame image data respectively included in the plural dynamic image data, and a correction unit that compares information of a detection position of the part to be detected from the respective dynamic image data and corrects at least a part of the information of the detection position of the part to be detected from the respective dynamic image data on a basis of a result of comparison.


Find Patent Forward Citations

Ikeda, Hitoshi. (2010). Image analysis apparatus (U.S. Patent No. 7650014). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7650014

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