The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Oct. 02, 2008
Applicants:
Baojun LI, Waukesha, WI (US);
Thomas Louis Toth, Brookfield, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Inventors:
Baojun Li, Waukesha, WI (US);
Thomas Louis Toth, Brookfield, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
Abstract
An imaging system includes at least two x-ray sources, an x-ray detector assembly and an attenuation filter. The at least two x-ray sources are displaced along a z-axis and configured to alternately emit x-ray beams. The x-ray detector assembly is configured to detect the x-ray beams. The attenuation filter is mounted proximate the at least two x-ray sources and is configured to provide different amounts of x-ray attenuation to the x-ray beams along the z-axis.