The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Jun. 15, 2007
Applicants:

Akira Hagiwara, Tokyo, JP;

Kenichi Nishizawa, Tokyo, JP;

Inventors:

Akira Hagiwara, Tokyo, JP;

Kenichi Nishizawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method for positively acquiring projection data for reconstructing a CT image at a slice position outside the linear movement range. When performing 'projection data acquisition' with 'rotating' and “linearly moving” the X-ray tube and the multidetector, a holding time is provided in which only the “rotation” is performed without “linear movement” at the starting point and the end point of the linear movement. By adjusting the holding time, the projection data in the view angle range required for image reconstruction of a CT at the slice position outside the linear movement range can be positively acquired, when the rotating velocity is slower or when the linear movement velocity is faster.


Find Patent Forward Citations

Hagiwara, Akira. (2010). X-ray ct data acquisition method and x-ray ct apparatus (U.S. Patent No. 7649972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7649972

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…