The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Jun. 01, 2004
Bernhard Braunecker, Rebstein, CH;
Peter Kipfer, Berneck, CH;
Bernhard Braunecker, Rebstein, CH;
Peter Kipfer, Berneck, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
The invention relates to an optical inclinometer. According to the invention, an incline-dependent medium, e.g. a liquid surface, is positioned in the pupil of an optical subsystem and a detectable wave front is imaged onto a detector by means of said medium. A phase displacement of radiation emitted from a radiation source is caused by said medium; the interaction of the radiation and the medium can take place during reflection or transmission. An aberration of the wave front caused by the medium can be analyzed by means of a wave front sensor and compensated by an evaluation unit or the detector. A wave front sensor having a diffractive structure formed upstream of each subaperture is compact and increases the resolution and the detectable angular region of the inclinometer.