The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Sep. 19, 2003
Applicants:
Ikuo Hayaishi, Nagano-ken, JP;
Takahiko Koizumi, Nagano-ken, JP;
Inventors:
Ikuo Hayaishi, Nagano-ken, JP;
Takahiko Koizumi, Nagano-ken, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/208 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract
At least either of image data and image generation record information is analyzed to determine an image quality parameter relating to image quality, and an output target decision regarding selection of image data as an output target is performed on the basis of the image quality parameter.
Hayaishi, Ikuo. (2010). Selection of image data for output (U.S. Patent No. 7649556). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7649556
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile