The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Sep. 01, 2006
Alexander Fishman, Sunnyvale, CA (US);
Denis Y. Lefebvre, Salinas, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Chonghua Zhou, Diamond Bar, CA (US);
Robert L. Fennelly, San Jose, CA (US);
Alexander Fishman, Sunnyvale, CA (US);
Denis Y. Lefebvre, Salinas, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Chonghua Zhou, Diamond Bar, CA (US);
Robert L. Fennelly, San Jose, CA (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
One example of a test board includes first and second communication ports configured for communication with a master device and a DUT, respectively. A bit error rate tester of the test board is arranged for communication with the master device and with the DUT by way of the first and second communication ports, respectively, and the bit error rate tester includes at least one IC whose maximum data rate is temperature sensitive. Finally, the test board includes a temperature control system arranged to control the IC temperature so that a maximum data rate of the IC can be adjusted through the use of thermal effects.