The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2010

Filed:

Sep. 26, 2007
Applicants:

Ersin Bayram, Delafield, WI (US);

Charles R. Michelich, Waukesha, WI (US);

Anthony T. VU, Waukesha, WI (US);

Reed F. Busse, Madison, WI (US);

Inventors:

Ersin Bayram, Delafield, WI (US);

Charles R. Michelich, Waukesha, WI (US);

Anthony T. Vu, Waukesha, WI (US);

Reed F. Busse, Madison, WI (US);

Assignee:

General Electric Co., Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-shot three-dimensional (3D) magnetic resonance imaging (MRI) data view-ordering strategy for uniform or variable density k-space sampling schemes is presented. The k-kplane is partitioned into multiple wedge-shaped 'blades' (or radial fan beams). The angular size of individual blades may be adjusted according to the desired number of views for each blade. Each blade includes views near the origin that contain low-frequency information about the imaged object such that views having the most desirable characteristics may be used to fill the central portions of k-space.


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