The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
Jan. 28, 2005
Bentley N. Scott, Garland, TX (US);
Bentley N. Scott, Garland, TX (US);
Phase Dynamics, Inc., Richardson, TX (US);
Abstract
Systems and methods for measuring the moisture and sediment content of a sample. In one embodiment, a sample to be tested is collected in a field bottle. The sample from the field bottle is then transferred from the field bottle, and into and through an analysis bottle containing a desiccant material. As the sample is being pulled through the analysis bottle, a microwave measurement system (or other scattering parameter measuring system) is used to measure the effects of the sample on the scattering parameters of the desiccant material. By measuring the effects of the sample on the scattering parameters of the desiccant material, the sample's moisture content can be determined. The sample's moisture can also be determined by measuring the expanded volume of the desiccant. A filter section having a sight glass with graduations is used to determine the sediment content of the sample.