The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2010
Filed:
May. 28, 2008
Jason William Pelecanos, Ossining, NY (US);
Douglas George Heintzman, Pleasantville, NY (US);
Jiri Navratil, White Plains, NY (US);
Ganesh N. Ramaswamy, Mohegan Lake, NY (US);
Jason William Pelecanos, Ossining, NY (US);
Douglas George Heintzman, Pleasantville, NY (US);
Jiri Navratil, White Plains, NY (US);
Ganesh N. Ramaswamy, Mohegan Lake, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and program storage device are provided for machine diagnostics, detection and profiling using pressure waves, the method including profiling known sources, acquiring pressure wave data, analyzing the acquired pressure wave data, and detecting if the analyzed pressure wave data matches a profiled known source; the system including a processor, a pressure wave transducer in signal communication with the processor, a pressure wave analysis unit in signal communication with the processor, and a source or threat detection unit in signal communication with the processor; and the program storage device including program steps for profiling known sources, acquiring pressure wave data, analyzing the acquired pressure wave data, and detecting if the analyzed pressure wave data matches a profiled known source.