The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
May. 26, 2006
Magdy S. Abadir, Austin, TX (US);
Jing Zeng, Dripping Springs, TX (US);
Benjamin N. Lee, Santa Barbara, CA (US);
Magdy S. Abadir, Austin, TX (US);
Jing Zeng, Dripping Springs, TX (US);
Benjamin N. Lee, Santa Barbara, CA (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method of testing critical delay paths of an integrated circuit design is disclosed. The method includes predicting and ranking a set of critical delay paths based on a set of predicted delay characteristics. Integrated circuits based on the integrated circuit design are tested to determine a set of actual delay measurements for the critical delay paths. The critical delay paths are ranked based on the actual delay measurements, and the results are correlated to the predicted ranking of critical delay paths to produce a confidence measurement that measures the likelihood that the actual critical delay paths of the design have been tested for a given production batch of devices.