The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2010

Filed:

Aug. 31, 2005
Applicants:

Rich Endo, Los Angeles, CA (US);

David Brookler, Los Angeles, CA (US);

David Sullivan, Cahoga Park, CA (US);

Inventors:

Rich Endo, Los Angeles, CA (US);

David Brookler, Los Angeles, CA (US);

David Sullivan, Cahoga Park, CA (US);

Assignee:

SAP, AG, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Enables search and test for at least one value in layers of audience specific data comprising language, regional, regulatory and/or cultural specific values per layer. The word 'audience' for the purposes of this specification means a group of document consumers such as people or computers that are associated with a language, country, region, regulation, culture or any other user defined division. A search utilizing at least one embodiment of the invention occurs with respect to data that makes use of rule-based inheritance. Testing multiple audience layers for all values that meet a specific fine or coarse grained search criteria allows quality assurance testing across all target audiences for a document before publication.


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