The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Jul. 11, 2005
Applicants:
James M. Overturf, Murphy, TX (US);
Lajos Molnar, Rowlett, TX (US);
Inventors:
James M. Overturf, Murphy, TX (US);
Lajos Molnar, Rowlett, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01); G06F 9/44 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A modular instance-aware event-driven test framework is described. It includes an event-driven test framework, a transition-graph test model for the event-driven text framework, an instance-aware event-driven test framework built on said event-driven test framework and a transition-graph test model for said instance-aware event-driven test framework built on said transition-graph test model.