The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Jul. 24, 2006
Mamoru Uemura, Kobe, JP;
Kenichi Takahashi, Osaka, JP;
Yasutaka Arino, Fukuoka, JP;
Akinobu Seko, Kobe, JP;
Yuji Takano, Fukuoka, JP;
Mamoru Uemura, Kobe, JP;
Kenichi Takahashi, Osaka, JP;
Yasutaka Arino, Fukuoka, JP;
Akinobu Seko, Kobe, JP;
Yuji Takano, Fukuoka, JP;
Sysmex Corporation, Hyogo, JP;
Abstract
An analyzing system, comprising: a sample processor for processing a sample based on a designated dilution parameter; a measurement section for measuring the sample processed by the sample processor; a dilution parameter memory for storing a first dilution parameter and a second dilution parameter which is different from the first dilution parameter and can be supplied by a user of the analyzing system; and a measurement controller for controlling the sample processor and the measurement section so as to process the sample based on the first dilution parameter and obtain a measurement value by measuring the processed sample; wherein, when a comparison of the measurement value and a predetermined threshold indicates a retest, the second dilution parameter is used for the retest, is disclosed. A diagnostic processing device and computer program product thereof are also disclosed.