The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Mar. 09, 2006
Randall P. Sadowski, Hookstown, PA (US);
John T. Campbell, Jr., Bridgeville, PA (US);
Mark A. Glavach, Slippery Rock, PA (US);
Scott A. Miller, Oakdale, PA (US);
Keith A. Overstreet, Pittsburgh, PA (US);
David T. Sturrock, Evans City, PA (US);
Randall P. Sadowski, Hookstown, PA (US);
John T. Campbell, Jr., Bridgeville, PA (US);
Mark A. Glavach, Slippery Rock, PA (US);
Scott A. Miller, Oakdale, PA (US);
Keith A. Overstreet, Pittsburgh, PA (US);
David T. Sturrock, Evans City, PA (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
A system that facilitates determination of a sampling rate to utilize in connection with sampling data in an industrial environment comprises a receiver component that receives data from an I/O port of a controller. An analysis component automatically and dynamically determines a rate at which data associated with the I/O port is to be sampled based at least in part upon the received data. The system can further comprise a sampling component that samples data at the rate determined by the analysis component.