The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7646892 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 12, 2010

Filed:

Nov. 04, 2005
Applicants:

Tetsuya Satou, Nara, JP;

Toshimasa Kuchii, Nara, JP;

Inventors:

Tetsuya Satou, Nara, JP;

Toshimasa Kuchii, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image inspecting apparatus invention includes an original image storing memory 21 for storing an image data output from an image sensor 11, a filtering processing section 22 for obtaining a shading component-removed data in which the shading component is removed from the output image data, a preliminary processing memory 23 for storing the shading component-removed data, a block dividing/adding section 24 for dividing the shading component-removed data into blocks with a size of n×m and adding the shading component-removed data within the divided blocks to obtain a block divided/added data, a secondary processing memory 25 for storing the block divided/added data, a statistics processing section 26 for calculating an average value, a maximum value and a minimum value for the block divided/added data, a quality determining section 27 for determining a quality with the calculated average value, maximum value and minimum value and a determination result storing memory 28 for storing information for the block which has been determined.


Find Patent Forward Citations

Satou, Tetsuya. (2010). Image inspecting apparatus, image inspecting method, control program and computer-readable storage medium (U.S. Patent No. 7646892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7646892

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…