The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
May. 11, 2005
Hai-wen Chen, Orlando, FL (US);
Hai-Wen Chen, Orlando, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method and system, for detecting closely spaced objects with data from an imaging sensor. A CFAR detector performs detection on the image data at a threshold level. A processor runs a first algorithm on exceedances above the CFAR threshold. The first algorithm is for single target detection and includes a local-max algorithm that identifies multiple exceedances within a 2×2 matrix of image data and only keeps exceedance with the maximum value. All other exceedances in image are single target detections. The processor runs a second algorithm that identifies multiple exceedances (single target detections) within a local regional area across the whole image. The regional area size may be a 3×3, 4×4, or 5×5 matrix depending on the specified CSO separations. This algorithm may use a regional moving window across the whole image. An alternative method using the indices of all the exceedances' (x,y) coordinates is also disclosed.
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