The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Nov. 24, 2005
Applicant:
Lasse Suominen, Säynätsalo, FI;
Inventor:
Lasse Suominen, Säynätsalo, FI;
Assignee:
Stresstech Oy, Vaajakoski, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a goniometer () and a method for measuring stresses and characterizing microstructure of particles. The goniometer comprises frame (), a measurement head () movably adapted to the frame () by a first linear movement unit (), second linear movement unit () and a tilting movement unit (), for performing measurement at a measurement point. According to the invention the axis of rotation () of the tilting movement unit () does not coincide with the measurement point, and the device has means () for creating arc-formed movement of the measurement head () during the measurement with said movement units ().